IXRF Systems Microanalysis & microXRF
Analytical Instrumentation Iridium Ultra Software
Leading Microanalysis Innovation SEM/EDS | SEM/EDX Energy Dispersive X-ray
Fluorescence Spectrometry
for Electron Microscopy New Systems & Upgrades ATLAS M Benchtop microXRF Micro-spot Energy Dispersive
X-ray Fluorescence Spectrometry SEM-XRF Integrated e-Beam / X-ray Beam X-ray Sources for
Electron Microscopy ATLAS X microXRF Ultimate Micro-spot Hyperspectral
XRF Imaging Spectrometer System

∙ Up to 280 mm² SDD for fast maps

∙ 5 um spot size for highest spatial resolution

∙ Largest chamber with 300 x 400 mm mapping

∙ Perpendicular tube geometry for round pixels

∙ Easy-to-use Iridium Ultra software w/ automation

Our Products

IXRF designs and manufactures high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM/EDS). IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. Additionally IXRF offers the ATLAS series of general purpose, microXRF energy dispersive X-ray fluorescence (microXRF) spectrometers for elemental analysis and hyperspectral imaging of elements from carbon (C) through uranium (U). We specialize in: SEM/EDS, SEM-XRF and microXRF.
Made in U.S.A.

micro-XRF

Imaging microXRF Spectrometers

The ATLAS series of micro-XRF microscopic hyperspectral imaging spectrometers are the latest general-purpose micro X-ray spot energy dispersive X-ray fluorescence (EDXRF) instruments for the measurement and mapping of elements from sodium (Na) through uranium (U).

Designed to image and analyze a wide variety of sample types, ATLAS leads the industry in virtually every major specification category, from the most powerful software  (Iridium Ultra) and the largest detector active area to our superior perpendicular geometry and smallest micro-spot.

Microanalysis

SEM/EDS — SEM-XRF — SDD

SEM/EDS:  For scanning electron microscopes (SEM), we offer a complete EDS (EDX) system: software,  SDD detectors, digital signal processors, and software. Our Windows®-10 based EDS software – Iridium Ultra – delivers all-inclusive functionality.

SEM-XRF:  IXRF’s Xb micro-spot X-ray source adds the capabilities of a complete micro X-ray fluorescence (microXRF) spectrometer to any scanning electron microscope (SEM). μXRF users benefit from non-destructive measurements, superior trace element sensitivity, and broader elemental coverage (Na through U).

Recent Articles

Analysis of Complex Petrological Thin Sections – A MicroXRF Case Study on Ledmore Quarry Samples

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In northwest Scotland, the Ledmore Quarry offers a unique geological setting where an alkali syenite intrusion transformed surrounding limestone into marble, resulting in rare mineral assemblages like brucite marble, Ledmoreite,…

Advancing Fischer-Tropsch Catalyst Research with MicroXRF – Enhancing Catalyst Performance and Sustainability

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At IXRF Systems, we are proud to contribute to cutting-edge research that supports sustainable energy and industrial innovation. Recently, our Atlas Micro-XRF spectrometer played a role in a preliminary study…

Transforming Agriculture Research with MicroXRF

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Understanding the intricate interactions between plants, soils, and nutrients is vital to sustainable crop production and effective agricultural environmental management. High-resolution micro X-ray Fluorescence (microXRF) technology, such as the Atlas…

Enhancing Geological Thin Section Analysis with MicroXRF – A Modern Approach to Petrology

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Geological thin sections provide a unique glimpse into Earth's past, revealing critical details about the planet’s structure, composition, and history. These precisely prepared slices, each about 30 microns thick, allow…

Discovering the Future of Steel Analysis with Veritas MacroXRF

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Staying ahead of industry challenges requires innovative solutions in the dynamic world of steel manufacturing. Enter Veritas, IXRF Systems' groundbreaking advancement in MacroXRF technology. Designed to lead the field of…

Case Study – The Advantages of MicroXRF Over EDS for Metallurgical Analysis

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Selecting the proper analytical technique is crucial in materials characterization, particularly in metallurgical and alloy applications. Two commonly used methods, Energy Dispersive Spectroscopy (EDS) and Micro X-ray Fluorescence (microXRF), offer…
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ATLAS M

IXRF Systems specializes in micro-spot X-ray fluorescence (XRF) spectrometers employing energy dispersive detectors (EDXRF). XRF is an X-ray spectrometric technique for elemental analysis of a wide variety of materials. Other phrases for XRF instruments include: microXRF, microEDXRF, micro-XRF, micro-EDXRF, μXRF, μEDXRF, micro XRF, energy dispersive X-ray spectrometry, energy dispersive spectrometry (EDS or EDX), X-ray spectroscopy, energy dispersive X-ray spectroscopy, XRF analyzer, XRF spectrometer, XRF analysis, X-ray fluorescence analyzer, x-ray fluorescence spectrometry, fluorescence x, spectromètre de fluorescence X, Röntgenfluoreszenzanalyse, fluorescencia de rayos X, Röntgenfluoreszenz, Röntgenfluorescentie, Röntgenfluorescens, Röntgenfluoresenssi, Røntgenfluorescens and Promieniowanie rentgenowskie.

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HAVE QUESTIONS?

FAQs

What type of EDS detectors does IXRF offer?

IXRF offers a multitude of different X-ray detectors. You may choose from several different guaranteed resolutions.

I am interested in an upgrade. Can I use my existing EDS detector?

Yes, IXRF was designed to interface with most detectors. We have not come across one which was incompatible. In many cases light element sensitivity is increased due to our digital pulse processing electronics.

When I upgrade my IXRF software, what needs to be done?

Simply download the latest version and install it.

Once I buy an IXRF system and later decide to change to a different SEM, can the IXRF system be adapted to a different SEM?

It the majority of situations, yes the detector can be fitted to be moved to the new SEM. Please contact IXRF at the beginning of your planning so that we can verify if your detector can work for the SEM you are considering purchasing.

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