For our SEM-EDS, SEM-XRF and microEDXRF products, IXRF offers Iridium Ultra: an all-inclusive state-of-the-art software suite featuring a myriad of comprehensive qualitative and quantitative capabilities supporting both e-beam and X-ray excitation. Included are stage control and automation, data acquisition, spectral manipulation (including deconvolution and artifact removal), mapping, imaging, and statistical analysis tools. The platform is unsurpassed in it’s ability to provide elemental and phase mapping, line scans, critical dimensions (CD) as well as qualitative and quantitative elemental analyses. For the ATLAS microXRF line, this includes analysis of solids, liquids, particles, powders and thin films.
Advanced EDS/XRF Elemental Analysis & Imaging Software
IRIDIUM ULTRA
Spectra Overview
- Identifying Elements
- Spectrum Processing
- Annotations
- Spectrum Overlay
- Spectrum Reporting
Identify Elements
Kα Energy Markers help easily identify elemental peaks
Identify elements through cursor ID by selecting individual energy channels.
Spectrum Processing
• Peak separation using Gaussian deconvolution
• Automatic peak-overlap correction
• Automatic escape and sum peak removal
• Automatic Standardless Quantification using ZAF
Annotation
Selecting Annotations from the Spectrum toolbar opens a new window that allows the user to measure, label, add text, etc. on the spectrum. These annotations are fully customizable and can be exported with the spectrum.
Spectrum Overlay
Spectra can be overlaid to easily compare the relative compositions in samples
Spectrum Reporting
Create a simple spreadsheet report of multiple spectra’s quantitative analysis.
