New SEM-XRF brochure is now available from IXRF, Inc. Request your copy below.
Addition of an polycapillary X-ray tube and Iridium Ultra software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental sensitivity for higher Z elements: sensitivity exceeding e–-beam excitation by a factor of 10-1000X. Exceptional beam stability, together with a modern SDD X-ray detector, afford higher precision with ppm-level sensitivity. Non-conductive materials may be analyzed without any special preparation or coating. We integrate with your SEM to deliver full spectrum analysis using excitation from both the e–-beam and our X-ray source.
