Why add a micro X-ray source and state-of-the-art EDS software to your SEM ?

X-ray sources for Scanning Electron Microscopes: addition of a polycapillary optic equipped X-ray tube and analytical software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental sensitivity for high-Z elements: sensitivity exceeding e-beam excitation by a factor of 10-1000X. Non-conductive materials may be analyzed without any special preparation or coating. We integrate with your SEM to deliver full spectrum analysis using excitation from both the e-beam and our X-ray source. Find out more …